US citizenship Required
Prior 2-10 years of professional experience in SoC/ASIC Digital Design with focus on Design for Test (DFT)
Should possess intimate knowledge of DFT insertion flows
Basic scan chain insertion using synthesis or other software tools
Experience in compression scan insertion, LBIST and other scan technologies
Intimate knowledge of memory build-in self-test (MBIST)
Expertise in Automatic Test Pattern Generation (ATPG) to achieve design test coverage goals
Debug and Analysis of failures to improve fault coverage
Verification of ATPG testbenches and debugging root cause of simulation mis-compares
Working knowledge of JTAG 1149.1/6, IEEE1500 and IEEE1687
Knowledge of timing analysis and equivalency checks would be added bonus
Ability to work in collaborative team environment
Prior experience with Cadence tools and flows is highly desirable
Should be able to finish DFT tasks independently
Strong problem-solving skills. Exhibit discipline, thoroughness, and methodical approach in solving problems
Ability to work with stakeholders across cross-functional teams – Architecture, Design, Internal and External Customers
Self-driven and committed individual who can work in a fast-paced project environment